Casgliadau Arlein
Amgueddfa Cymru
Chwilio Uwch
Silicon wafer
CRONOS test wafer after shallow etch test using STS' advanced silicon etch tool. Etched. Broken into 5 parts (some pieces missing). In original container (2001.202/42).
Pwnc
Diwydiant
Rhif yr Eitem
2001.202/3
Mesuriadau
diameter
(mm): 100
Nid yw sylwadau ar gael ar hyn o bryd. Ymddiheuriadau am yr anghyfleustra.